发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR SUBSTRATE
摘要 A manufacturing method of a semiconductor substrate includes: forming a trench in a semiconductor board by a dry etching method; etching a surface portion of an inner wall of the trench by a chemical etching method so that a first damage layer is removed, wherein the surface portion has a thickness equal to or larger than 50 nanometers; and performing a heat treatment at temperature equal to or higher than 1050° C. in non-oxidizing and non-azotizing gas so that crystallinity of a second damage layer is recovered, wherein the second damage layer is disposed under the first damage layer. The crystallinity around the trench is sufficiently recovered
申请公布号 US2013012004(A1) 申请公布日期 2013.01.10
申请号 US201213541885 申请日期 2012.07.05
申请人 DENSO CORPORATION;OHTSUKI HIROSHI;SHIBATA TAKUMI 发明人 OHTSUKI HIROSHI;SHIBATA TAKUMI
分类号 H01L21/306 主分类号 H01L21/306
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