OPTICAL MEASUREMENT ANALYSIS DEVICE, STORAGE ROOM, ELECTROMAGNETIC-WAVE GENERATING DEVICE, AND OPTICAL MEASUREMENT ANALYSIS METHOD

摘要

There is provided an optical measurement analysis device capable of applying light to substantially the entire surface of a to-be-analyzed object for improving the analysis accuracy. The optical measurement analysis device according to the present embodiment includes a container, a light source, a light irradiation unit, a light reception unit, a spectroscope unit, and an analyzing unit for analyzing an optical spectrum obtained by the spectroscope unit. The container has an inner wall adapted to reflect light reflected by the to-be-analyzed object and light transmitted therethrough.