| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve the problems that a semiconductor integrated device cannot be applied to a test of analogs module for handling an analog signal and test time cannot be shortened in the conventional technology. <P>SOLUTION: A semiconductor integrated device has: a plurality of analog modules in which analog signals are input and which have the same function; a signal selection circuit which selects an output of a first analog module, or outputs of analog modules except the first analog module among outputs of the plurality of analog modules according to a selection signal from a tester; and a calculation circuit with an addition circuit which adds the outputs of the analog modules selected by the signal selection circuit. <P>COPYRIGHT: (C)2013,JPO&INPIT |
