发明名称 HAFNIUM TANTALUM OXIDE DIELECTRICS
摘要 A dielectric layer containing a hafnium tantalum oxide film and a method of fabricating such a dielectric layer produce a dielectric layer for use in a variety of electronic devices. Embodiments include structures for capacitors, transistors, memory devices, and electronic systems with dielectric layers containing a hafnium tantalum oxide film structured as one or more monolayers.
申请公布号 US2013012031(A1) 申请公布日期 2013.01.10
申请号 US201213614059 申请日期 2012.09.13
申请人 MICRON TECHNOLOGY, INC.;AHN KIE Y.;FORBES LEONARD 发明人 AHN KIE Y.;FORBES LEONARD
分类号 H01L21/3105 主分类号 H01L21/3105
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