发明名称 |
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME |
摘要 |
Semiconductor devices and a methods of fabricating the semiconductor devices are provided. The semiconductor devices may include a pattern on a substrate. The semiconductor devices may also include a capping dielectric layer on the pattern. The semiconductor devices may further include a first nitride layer on the capping dielectric layer. Moreover, the semiconductor devices may include a second nitride layer on the first nitride layer. A concentration of nitrogen in the first nitride layer may be greater than that in the second nitride layer.
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申请公布号 |
US2013009213(A1) |
申请公布日期 |
2013.01.10 |
申请号 |
US201213617044 |
申请日期 |
2012.09.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;LIM JOON-SUNG;PARK JONGHO;HONG OKCHEON;PARK JUNG-HWAN |
发明人 |
LIM JOON-SUNG;PARK JONGHO;HONG OKCHEON;PARK JUNG-HWAN |
分类号 |
H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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