发明名称 Linear-carrier phase-mask interferometer
摘要 A phase-difference sensor measures the spatially resolved difference in phase between orthogonally polarized reference and test wavefronts. The sensor is constructed as a linear-carrier phase-mask aligned to and imaged on a linear-carrier detector array. Mireau and Fizeau polarization interferometric objectives are implemented with a thin conductive wire grid optically coupled to the objective beam splitter.
申请公布号 US8351048(B2) 申请公布日期 2013.01.08
申请号 US20100856723 申请日期 2010.08.16
申请人 4D TECHNOLOGY CORPORATION;MILLERD JAMES E. 发明人 MILLERD JAMES E.
分类号 G01B9/02 主分类号 G01B9/02
代理机构 代理人
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