| 摘要 |
A method and system for generation of low-slew indices for circuit characterization are disclosed. In one embodiment, a method for automatically generating a subset of sampling points from a set of load and slew points for circuit characterization includes iteratively obtaining sampling points such that error between an actual value and an interpolated intermediate value is below or equal to a threshold error value. The subset of sampling points is then formed from the iteratively obtained sampling points.
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