发明名称 Implanted metal silicide for semiconductor device
摘要 A device and a method for forming a metal silicide is presented. A device, which includes a gate region, a source region, and a drain region, is formed on a substrate. A metal is disposed on the substrate, followed by a first anneal, forming a metal silicide on at least one of the gate region, the source region, and the drain region. The unreacted metal is removed from the substrate. The metal silicide is implanted with atoms. The implant is followed by a super anneal of the substrate.
申请公布号 US8349732(B2) 申请公布日期 2013.01.08
申请号 US20080176133 申请日期 2008.07.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;CHUANG HARRY;TSAI HUNG-CHIH;KU KEH-CHIANG;THEI KONG-BENG;LIANG MONG SONG 发明人 CHUANG HARRY;TSAI HUNG-CHIH;KU KEH-CHIANG;THEI KONG-BENG;LIANG MONG SONG
分类号 H01L29/78;H01L21/44 主分类号 H01L29/78
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