发明名称 Specimen processing device and specimen processing method
摘要 A specimen processing device comprising: first and second units for processing specimens; a conveyance unit for conveying a specimen rack in a first direction from a first position where the specimen is retrieved by the first unit to a second position where the specimen is retrieved by the second unit, and a second direction opposite to the first position; a detector common to the first and second units for executing a detection process with respect to the sample containers; and a conveyance controller controlling the conveyance unit to convey some sample containers of the detected sample containers executed with the detection process to the first position, and to convey the other sample containers of the detected sample containers to the second position, the some sample containers and the other sample containers being held by a common rack, is disclosed. A specimen processing method is also disclosed.
申请公布号 US8347743(B2) 申请公布日期 2013.01.08
申请号 US20100775866 申请日期 2010.05.07
申请人 SYSMEX CORPORATION;HAMADA YUICHI;NAGAI TAKAAKI;SHIBATA MASAHARU 发明人 HAMADA YUICHI;NAGAI TAKAAKI;SHIBATA MASAHARU
分类号 B01L3/02 主分类号 B01L3/02
代理机构 代理人
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