发明名称 Near-field scanning optical microscopy with nanoscale resolution from microscale probes
摘要 To date, the probes of scanning near-field optical microscopes were aimed at creating electromagnetic field characteristics that are maximally localized near a nano-sized point (miniature apertures and tips, fluorescent nano-particles and molecules, dielectric and metal corners). Alternatively, the probe field, which is distributed within a larger area, can ensure the super-resolution as well. For this purpose, the field spectrum should be enriched with high spatial frequencies corresponding to small sample dimensions. As examples of such near-field probes, we propose and theoretically study the models of optical fibers with end-faces containing sharp linear edges and randomly distributed nanoparticles. These probes are more robust than the conventional probes and their fabrication is not concerned with nanoscale precision. The probes enable waveguiding of light to and from the sample with marginal losses distributing and utilizing the incident light more completely. Numerical modeling shows that, even with substantial measurement noise, the suggested probes can resolve objects that are significantly smaller than the probe size and, in certain cases, can perform better than miniature nanoprobes.
申请公布号 US8353061(B2) 申请公布日期 2013.01.08
申请号 US20090387642 申请日期 2009.05.04
申请人 OFS FITEL, LLC;SUMETSKY MIKHAIL 发明人 SUMETSKY MIKHAIL
分类号 G01Q60/22 主分类号 G01Q60/22
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