发明名称 Circuit for detecting malfunction generation attack and integrated circuit using the same
摘要 An embodiment of the invention provides a circuit for detecting a malfunction generation attack, including: at least one sensor circuit adapted to detect a radiation of a light; and a detection circuit for detecting an intermediate voltage between a voltage corresponding to a High level and a voltage corresponding to a Low level in accordance with an output from the at least one sensor circuit, and outputting a detection signal. At least one sensor circuit has an output node a level at which is changed in accordance with the radiation of the light, and outputs a signal corresponding to the level at the output node which is changed in accordance with the radiation of the light. The detection circuit outputs the detection signal when a level of the output signal from the at least one sensor circuit reaches a level previously set.
申请公布号 US8350574(B2) 申请公布日期 2013.01.08
申请号 US20100786612 申请日期 2010.05.25
申请人 SONY CORPORATION;NOBUKATA HIROMI 发明人 NOBUKATA HIROMI
分类号 G01R31/02;G01R31/08;H04K1/00 主分类号 G01R31/02
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