发明名称 Transitional interface between metal and dielectric in interconnect structures
摘要 An integrated circuit structure and methods for forming the same are provided. The integrated circuit structure includes a semiconductor substrate; a dielectric layer over the semiconductor substrate; an opening in the dielectric layer; a conductive line in the opening; a metal alloy layer overlying the conductive line; a first metal silicide layer overlying the metal alloy layer; and a second metal silicide layer different from the first metal silicide layer on the first metal silicide layer. The metal alloy layer and the first and the second metal silicide layers are substantially vertically aligned to the conductive line.
申请公布号 US8349730(B2) 申请公布日期 2013.01.08
申请号 US20100823649 申请日期 2010.06.25
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;SHIH CHIEN-HSUEH;SHUE SHAU-LIN 发明人 SHIH CHIEN-HSUEH;SHUE SHAU-LIN
分类号 H01L21/44;H01L23/52 主分类号 H01L21/44
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