发明名称 INSTRUMENTATION CIRCUIT FOR SHUNT-BASED METROLOGY MEASUREMENT
摘要 The present subject matter is directed to methods and apparatus for measuring current flow from a source at a first frequency using matched voltage drops in paired voltage drop circuits. The paired voltage drop circuits each comprise a fixed value component, such as a resistor, and an adjustable value component, such as an adjustable current source, coupled in series. The adjustable valued components are controlled based on differences in voltage drops produced by the voltage drop circuits based on a high-frequency signal, higher in frequency than the first frequency, applied to a control input for the adjustable value components.
申请公布号 CA2755382(C) 申请公布日期 2013.01.08
申请号 CA20112755382 申请日期 2011.10.20
申请人 ITRON, INC. 发明人 VAN WYK, HARTMAN;HADDAB, YOUCEF;DORMAND, JEAN-JACQUES
分类号 G01R19/00;G01R21/06 主分类号 G01R19/00
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