| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a diagnostic device for specifying an abnormal place with simple configurations since when diagnostic items are increased, the configurations become complicate, and it is not possible to specify any abnormal place in the diagnostic device of a signal input circuit in which the voltage of an input signal and a reference voltage are selected, and converted into a digital value, and a failure place is specified from this digital value. <P>SOLUTION: The diagnostic device is configured to measure an input signal voltage, a reference voltage, a voltage obtained by inverting the polarity of the reference voltage, and a difference voltage of the same signal by using a multiplexer, and to diagnose abnormalities from those voltage values. Thus, it is possible to detect various abnormalities, and to specify failure places with simple configurations. <P>COPYRIGHT: (C)2013,JPO&INPIT |
