发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To accurately perform reading operation. <P>SOLUTION: When performing reading operation of memory transistors, a controlling circuit applies a first voltage to a selected word line connected to a selected memory transistor. The controlling circuit applies second voltages that bring the memory transistors into conduction regardless of data held by the memory transistors to non-selected word lines connected to non-selected memory transistors excluding the selected memory transistor. The controlling circuit applies third voltages to bit lines. The controlling circuit applies a fourth voltage smaller than the third voltages to a selected source line connected to a memory string in which the selected memory transistor in a selected memory block is included out of source lines. The controlling circuit applies fifth voltages that are substantially the same as the third voltages to non-selected source lines to which non-selected memory strings are connected in the selected memory block out of the source lines. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013004123(A) 申请公布日期 2013.01.07
申请号 JP20110131776 申请日期 2011.06.14
申请人 TOSHIBA CORP 发明人 MAEJIMA HIROSHI;SAKAGUCHI NATSUKI
分类号 G11C16/02;G11C16/04;G11C16/06 主分类号 G11C16/02
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