| 摘要 |
<P>PROBLEM TO BE SOLVED: To improve the yield of and reduce a failure rate in a light-emitting device. <P>SOLUTION: A plurality of fused light-emitting diode elements 14, each having a light-emitting diode element 12 and a fuse 13 connected in series, are connected in parallel to form a parallel structure unit 15. And a light-emitting diode element circuit 16 is formed with one parallel structure unit 15 or with two or more parallel structure units 15 which are connected in series. For this reason, even when any of the light-emitting diode elements 12 causes a short-circuit failure, the light-emitting diode element 12 which has caused the short-circuit failure will have a fuse 13 connected thereto burned out, so that an overcurrent can be cut off. As a result, the light-emitting diode elements 12 other than the one which has caused the short-circuit failure can continue to emit light, allowing a light-emitting device 11 to continue to operate. Therefore, it is possible to improve the yield of the light-emitting device 11 and reduce a failure rate in it. <P>COPYRIGHT: (C)2013,JPO&INPIT |
