发明名称 SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD THEREFOR, AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor substrate and a manufacturing method therefor in which the upper and lower silicon surfaces in a cavity do not adhere to each other during the manufacturing process of a device such as a pressure sensor, and to provide a semiconductor device having a highly accurate small diaphragm. <P>SOLUTION: In a silicon substrate 1 having a diaphragm 100 of SON structure 101 and a manufacturing method therefor, convex islands 4 are formed on a lower silicon surface 3 in a cavity 2 constituting the SON structure 101. Hole groups having different depth are formed on the surface of the semiconductor substrate, and subjected to high temperature annealing thus forming one large cavity. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013004709(A) 申请公布日期 2013.01.07
申请号 JP20110133919 申请日期 2011.06.16
申请人 FUJI ELECTRIC CO LTD 发明人 KURIBAYASHI HITOSHI
分类号 H01L29/84;B81B3/00;B81C99/00;G01L9/00 主分类号 H01L29/84
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