发明名称 METHOD AND APPARATUS FOR ANALYZING SAMPLE USING TERAHERTZ WAVE
摘要 PURPOSE: A method and a device for analyzing a sample using terahertz waves are provided to reduce time required for obtaining images for analyzing the sample as one antenna emits terahertz waves having different emission angles at the same time. CONSTITUTION: A device for analyzing a sample using terahertz waves comprises a signal generator(300), a transmitting antenna(320), a receiving antenna(380), a signal processor(400), and lenses(340,360). The signal generator generates terahertz waves. The transmitting antenna emits two or more electromagnetic waves having different emission angles by using the terahertz waves at the same time. The receiving antenna receives the two or more electromagnetic waves penetrated through the sample. The signal processor processes the received two or more electromagnetic waves, thereby obtaining analyzing images of the sample. The lenses are comprised in a front surface or a rear surface of the sample according to necessity and compensate the emission angles of the two or more electromagnetic waves, thereby making the electromagnetic waves incident to the sample to be parallel. [Reference numerals] (300) Signal generator; (320) Transmitting antenna; (380) Receiving antenna; (400) Signal processor; (AA) Lens; (BB) Measurement sample
申请公布号 KR20130001969(A) 申请公布日期 2013.01.07
申请号 KR20110062922 申请日期 2011.06.28
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 PYO, SEONG MIN;CHOI, JAE ICK;LEE, WANG JOO
分类号 G01N21/35 主分类号 G01N21/35
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