| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a magnetic force microscope capable of highly stably measuring distribution of absolute values of a magnetic field without changing a magnetization state of a probe. <P>SOLUTION: The magnetic force microscope includes: a cantilever 6; a probe 5; a displacement detector 8 for detecting displacement of the cantilever; a sample table 2; and movement means (3, 4, 11, 16, 17) for moving the sample table. The magnetic force microscope is for measuring height distribution and magnetic field distribution on a surface of a sample 1 placed on the sample table. The magnetic force microscope further includes a magnetic field applying device 14 for applying the magnetic field to the probe 5, controls output of the magnetic field applying device 14 so that magnetic force applied to the probe 5 is zero, and measures the magnetic field distribution on the surface of the sample. <P>COPYRIGHT: (C)2013,JPO&INPIT |
