发明名称 TESTING APPARATUS AND TESTING METHOD
摘要 PURPOSE: A testing apparatus and a testing method are provided to stop a test of a malfunctioning device by detecting the underflow of a buffer unit. CONSTITUTION: A buffer unit(58) buffers a data signal. A pattern generating unit(24) generates an expected value for a data signal and a control signal every test cycle of the test device. A read control unit(40) reads the data signal from the buffer unit every test cycle when a control signal indicates to read data from the buffer unit. A determining unit(42) compares the data signal read by the read control unit with the expected value generated from the pattern generating unit. [Reference numerals] (22) Timing generating unit; (23) Pattern memory; (24) Pattern generating unit; (36) Clock generating unit; (38) Data obtaining unit; (40) Read control unit; (42) Determining unit; (44) Test signal supply unit; (48) Designation unit; (58) Buffer unit; (AA) Signal for control
申请公布号 KR20130001673(A) 申请公布日期 2013.01.04
申请号 KR20120042694 申请日期 2012.04.24
申请人 ADVANTEST CORPORATION 发明人 OSHIMA HIROMI
分类号 G11C29/00;G01R31/28 主分类号 G11C29/00
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