| 摘要 |
A method is provided for compensating for impairment of an electrical signal output from a device under test (DUT), the impairment resulting from an impairment network. The method includes measuring an impaired electrical signal received at an electronic analyzer via the impairment network; applying a coded pulse sequence to the impairment network; estimating an impairment transfer function corresponding to the impairment based on the applied pulse sequence; and correcting the measured electrical signal using the impairment transfer function to determine the electrical signal output from the DUT.
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