发明名称 STRUCTURE AND METHOD TO INTEGRATE EMBEDDED DRAM WITH FINFET
摘要 Various embodiment integrate embedded dynamic random access memory with fin field effect transistors. In one embodiment, a first fin structure and at least a second fin structure are formed on a substrate. A deep trench area is formed between the first and second fin structures. A high-k metal gate is formed within the deep trench area. The high-k metal gate includes a high-k dielectric layer and a metal layer. A polysilicon material is deposited within the deep trench area adjacent to the metal layer. The high-k metal gate and the polysilicon material are recessed and etched to an area below a top surface of a substrate insulator layer. A poly strap is formed in the deep trench area. The poly strap is dimensioned to be below a top surface of the first and second fin structures. The first and second fin structures are electrically coupled to the poly strap.
申请公布号 US2013005129(A1) 申请公布日期 2013.01.03
申请号 US201213612069 申请日期 2012.09.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;KANAKASABAPATHY SIVANANDA;JAGANNATHAN HEMANTH;WANG GENG 发明人 KANAKASABAPATHY SIVANANDA;JAGANNATHAN HEMANTH;WANG GENG
分类号 H01L21/283 主分类号 H01L21/283
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