发明名称 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM AND PATTERN FORMING METHOD USING THE COMPOSITION
摘要 An object of the present invention is to provide an actinic ray-sensitive or radiation-sensitive resin composition that can form independent line patterns with high resolution and excellent shapes and shows excellent resist performances including roughness characteristics, and to provide an actinic ray-sensitive or radiation-sensitive film and a pattern forming method using the composition. The actinic ray-sensitive or radiation-sensitive resin composition contains a compound (P) that contains at least one phenolic hydroxyl group and at least one group in which a hydrogen atom of a phenolic hydroxyl group is substituted with a group represented by the following General Formula (1) (the respective symbols in the formula represent the same definitions as in the claims and the specification).
申请公布号 US2013004888(A1) 申请公布日期 2013.01.03
申请号 US201213528477 申请日期 2012.06.20
申请人 FUJIFILM CORPORATION;INASAKI TAKESHI;TSUCHIMURA TOMOTAKA 发明人 INASAKI TAKESHI;TSUCHIMURA TOMOTAKA
分类号 C08F212/08;G03F1/00;G03F1/50;G03F1/76;G03F1/78;G03F7/20 主分类号 C08F212/08
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