发明名称 |
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>The present invention provides a manufacturing method for a semiconductor structure. The method comprises: providing an SOI substrate, and forming a gate structure on the SOI substrate; etching an SOI layer and a BOX layer of the SOI substrate at two sides of the gate structure, so as to form a groove exposing the BOX layer, a part of the groove entering the BOX layer; forming a flank wall at the sidewall of the groove; and forming a metal layer covering the flank wall in the groove, the metal layer contacting the SOI layer below the gate structure. Correspondingly, the present invention further provides a semiconductor structure formed with the foregoing method. In the manufacturing method and the semiconductor structure provided in the present invention, when a semiconductor device is working, the capacitance between a metal layer and a bulk-silicon layer of an SOI substrate is reduced, so as to facilitate promotion of performances of the semiconductor device.</p> |
申请公布号 |
WO2013000196(A1) |
申请公布日期 |
2013.01.03 |
申请号 |
WO2011CN78877 |
申请日期 |
2011.08.25 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;BEIJING NMC CO., LTD.;YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG |
发明人 |
YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|