发明名称 Testing Circuit of Dual Gate Cell Panel and Color Display Method for Dualgate Cell Panel
摘要 A testing circuit of a dual gate cell panel and a color display method of the dual gate cell panel. There are many data lines and scan lines in the dual gate cell panel, and the data lines are divided into three groups, and the scan lines are divided into two groups. The data lines or scan lines of each group are connected respectively to metal wires with a test pad each. When an appropriate signal is inputted to each test pad, the dual gate cell panel shows red, green and blue colors individually, so that defects of the dual gate cell panel can be detected accurately to avoid any unnecessary waste on the defective dual gate cell panel incurred in the subsequent manufacturing processes.
申请公布号 US2013002738(A1) 申请公布日期 2013.01.03
申请号 US201113314546 申请日期 2011.12.08
申请人 HANNSTAR DISPLAY CORP.;LU TAI-FU 发明人 LU TAI-FU
分类号 G09G5/02 主分类号 G09G5/02
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