| 摘要 |
<p>The microscope has a detection unit (14) detecting temporal successive sample radiation of sections, in which the unit is directed to the radiation by a scanner (5) in a detection optical path. An intensity of a confocally formed sample radiation is detected in a wavelength-dependent manner. The unit comprises a color module (9) with displaceable color longitudinal imperfection. The module is arranged between the scanner and a section, and is traversed by the sample radiation, so that a sectional width to be detected is adjusted by a modification of the color longitudinal imperfection. An independent claim is also included for a microscopic method for measuring a surface profile of an object.</p> |
