发明名称 PROCESSING METHODS AND APPARATUS WITH TEMPERATURE DISTRIBUTION CONTROL
摘要 Wafer treatment process and apparatus is provided with a wafer carrier arranged to hold wafers and to inject a fill gas into gaps between the wafers and the wafer carrier. The apparatus is arranged to vary the composition, flow rate, or both of the fill gas so as to counteract undesired patterns of temperature non-uniformity of the wafers.
申请公布号 EP2539920(A1) 申请公布日期 2013.01.02
申请号 EP20100795886 申请日期 2010.12.14
申请人 VEECO INSTRUMENTS INC. 发明人 GURARY, ALEX;BELOUSOV, MIKHAIL;BOGUSLAVSKIY, VADIM;MITROVIC, BOJAN
分类号 H01L21/00;H01L21/687 主分类号 H01L21/00
代理机构 代理人
主权项
地址