| 摘要 |
PURPOSE: A chip selection circuit and a semiconductor device including the same are provided to reduce test time by activating all chips regardless of an address signal in a test operation. CONSTITUTION: A first chip selecting unit(100) generates a first chip selection signal(CS1) in response to a chip selection enable signal and an address signal. A second chip selecting unit(200) generates a second chip selection signal(CS2) in response to a chip selection enable signal and an address signal. A chip selection identifying unit generates a chip selection identification signal in response to the chip selection enable signal and the address signal. A chip selection control unit provides the chip selection identification signal or a signal fixed at a preset level as a chip selection signal in response to a test mode signal. A data input unit receives data in response to the chip selection signal. [Reference numerals] (10) Command buffer; (100) First chip selecting unit; (20) Address buffer; (200) Second chip selecting unit
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