发明名称 Method and apparatus for diagnosing status of parts in real time in plasma processing equipment
摘要 Apparatus and methods for diagnosing status of a consumable part of a plasma reaction chamber, the consumable part including at least one conductive element embedded therein. The method includes the steps of: coupling the conductive element to a power supply so that a bias potential relative to the ground is applied to the conductive element; exposing the consumable part to plasma erosion until the conductive element draws a current from the plasma upon exposure of the conductive element to the plasma; measuring the current; and evaluating a degree of erosion of the consumable part due to the plasma based on the measured current.
申请公布号 US8343305(B2) 申请公布日期 2013.01.01
申请号 US20070896637 申请日期 2007.09.04
申请人 LAM RESEARCH CORPORATION;PATRICK ROGER 发明人 PATRICK ROGER
分类号 C23C16/00;C23F1/00;H01L21/306 主分类号 C23C16/00
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