发明名称 Organic transistor, manufacturing method of semiconductor device and organic transistor
摘要 It is an object to form a high quality gate insulating film which is dense and has a strong insulation resistance property, and to propose a high reliable organic transistor in which a tunnel leakage current is little. One mode of the organic transistor of the present invention has a step of forming the gate insulating film by forming the conductive layer which becomes the gate electrode activating oxygen (or gas including oxygen) or nitrogen (or gas including nitrogen) or the like using dense plasma in which density of electron is 1011 cm−3 or more, and electron temperature is a range of 0.2 eV to 2.0 eV with plasma activation, and reacting directly with a portion of the conductive layer which becomes the gate electrode to be insulated.
申请公布号 US8343816(B2) 申请公布日期 2013.01.01
申请号 US20100850652 申请日期 2010.08.05
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;IMAHAYASHI RYOTA;FURUKAWA SHINOBU;ISOBE ATSUO;ARAI YASUYUKI;YAMAZAKI SHUNPEI 发明人 IMAHAYASHI RYOTA;FURUKAWA SHINOBU;ISOBE ATSUO;ARAI YASUYUKI;YAMAZAKI SHUNPEI
分类号 H01L21/00 主分类号 H01L21/00
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