发明名称 Semiconductor device having ferroelectric capacitor
摘要 The present invention provides a method for manufacturing a semiconductor device, including the steps of: forming a first ferroelectric film on a first conductive film by a film-forming method including at least a step of forming a film by a sol-gel method; forming a second ferroelectric film on the first ferroelectric film by a sputtering method; forming a second conductive film on the second ferroelectric film; and forming a capacitor provided with a lower electrode, a capacitor dielectric film and an upper electrode by patterning the first conductive film, the first and second ferroelectric films and the second conductive film.
申请公布号 US8344434(B2) 申请公布日期 2013.01.01
申请号 US201113100511 申请日期 2011.05.04
申请人 FUJITSU SEMICONDUCTOR LIMITED;WANG WENSHENG;HORII YOSHIMASA 发明人 WANG WENSHENG;HORII YOSHIMASA
分类号 H01L21/02;H01L21/00;H01L21/8242;H01L27/108;H01L29/94 主分类号 H01L21/02
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