发明名称 Metal gate transistors with raised source and drain regions formed on heavily doped substrate
摘要 An MOS transistor formed on a heavily doped substrate is described. Metal gates are used in low temperature processing to prevent doping from the substrate from diffusing into the channel region of the transistor.
申请公布号 US8344452(B2) 申请公布日期 2013.01.01
申请号 US20080011439 申请日期 2008.01.24
申请人 INTEL CORPORATION;LINDERT NICK;BRASK JUSTIN K.;WESTMEYER ANDREW 发明人 LINDERT NICK;BRASK JUSTIN K.;WESTMEYER ANDREW
分类号 H01L29/78 主分类号 H01L29/78
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