发明名称 Buildup dielectric layer having metallization pattern semiconductor package fabrication method
摘要 A method of manufacturing a semiconductor package includes mounting and electrically connecting a semiconductor die to a substrate. The semiconductor die and the substrate are encapsulated to form an encapsulation. Via holes are laser-ablated through the encapsulation and conductive material is deposited within the via holes to form vias. A first buildup dielectric layer is formed on the encapsulation. Laser-ablated artifacts are laser-ablated in the first buildup layer. The laser-ablated artifacts in the first buildup layer are filled with a first metal layer to form a first electrically conductive pattern in the first build up layer. The operations of forming a buildup layer, forming laser-ablated artifacts in the buildup layer, and filling the laser-ablated artifacts with an electrically conductive material to form an electrically conductive pattern can be performed any one of a number of times to achieve the desired redistribution.
申请公布号 US8341835(B1) 申请公布日期 2013.01.01
申请号 US20090387691 申请日期 2009.05.05
申请人 AMKOR TECHNOLOGY, INC.;HUEMOELLER RONALD PATRICK;RUSLI SUKIANTO;HINER DAVID JON 发明人 HUEMOELLER RONALD PATRICK;RUSLI SUKIANTO;HINER DAVID JON
分类号 H05K3/30 主分类号 H05K3/30
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