发明名称 Method fabricating phase-change semiconductor memory device
摘要 A method of fabricating a phase change memory having a unit memory cell is described. The unit memory cell includes a phase change element connected to a corresponding vertical cell diode. The phase change element is formed from a phase change material layer formed on an interlayer dielectric layer including a via hole, and etched using a plasma formed from a plasma gas having a molecular weight of 17 or less to form a respective phase change material pattern in the via hole.
申请公布号 US8343798(B2) 申请公布日期 2013.01.01
申请号 US201113084654 申请日期 2011.04.12
申请人 SAMSUNG ELECTRONICS CO., LTD.;CHOI BYOUNG-DEOG;BAE BYOUNG-JAE;PARK JEONG-HEE 发明人 CHOI BYOUNG-DEOG;BAE BYOUNG-JAE;PARK JEONG-HEE
分类号 H01L21/06 主分类号 H01L21/06
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