发明名称 Method for forming isolation layer of semiconductor device
摘要 A method for fabricating a semiconductor device includes forming an isolation layer which defines an active region in a substrate, forming recess patterns in the active region and the isolation layer, baking a surface of the recess pattern by conducting an annealing process and forming a gate dielectric layer over a surface of the recess pattern by conducting an oxidation process.
申请公布号 US8343879(B2) 申请公布日期 2013.01.01
申请号 US20100825592 申请日期 2010.06.29
申请人 HYNIX SEMICONDUCTOR INC.;JANG SE-AUG;KIM EUN-JEONG;LEE EUN-HA 发明人 JANG SE-AUG;KIM EUN-JEONG;LEE EUN-HA
分类号 H01L21/31 主分类号 H01L21/31
代理机构 代理人
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