发明名称 Nitride semiconductor device and method for fabricating the same
摘要 A nitride semiconductor device includes: a first nitride semiconductor layer; a second nitride semiconductor layer formed on the first nitride semiconductor layer and having a wider band gap than the first nitride semiconductor layer; and a third nitride semiconductor layer formed on the second nitride semiconductor layer. A region of the third nitride semiconductor layer located below the gate electrode is formed with a control region having a p-type conductivity, and a region of the third nitride semiconductor layer located between the gate electrode and each of the source electrode and the drain electrode is formed with a high resistive region having a higher resistance than the that of the control region.
申请公布号 US8344423(B2) 申请公布日期 2013.01.01
申请号 US201213360275 申请日期 2012.01.27
申请人 PANASONIC CORPORATION;UEMOTO YASUHIRO;HIKITA MASAHIRO;UEDA TETSUZO;TANAKA TSUYOSHI;UEDA DAISUKE 发明人 UEMOTO YASUHIRO;HIKITA MASAHIRO;UEDA TETSUZO;TANAKA TSUYOSHI;UEDA DAISUKE
分类号 H01L29/66 主分类号 H01L29/66
代理机构 代理人
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