发明名称 HEAT TREATMENT FURNACE AND HEAT TREATMENT APPARATUS
摘要 PURPOSE: A thermal processing furnace and a thermal processing apparatus are provided to uniformly heat a wafer by arranging a heater element on the inner surface of an insulation material. CONSTITUTION: A processing container receives one or more objects. A cylindrical insulation material(16) covers the circumferences of the processing container. A heater is arranged along the inner surface of the insulation material and includes a band-shaped heater element(18) of a core gate type arranged along the inner surface of the insulation material. The heater element has a valley protruding to the outside and a ridge protruding to the inside.
申请公布号 KR20120140625(A) 申请公布日期 2012.12.31
申请号 KR20120066283 申请日期 2012.06.20
申请人 NICHIAS CORPORATION;TOKYO ELECTRON LIMITED 发明人 KOBAYASHI MAKOTO;YAMAGA KENICHI;SASAKI AKIRA;IKEDA DAISUKE;KOIKE TAKAHIRO
分类号 H01L21/205;H01L21/02;H01L21/22 主分类号 H01L21/205
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