发明名称 PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <p>PURPOSE: A phase change memory device and a manufacturing method thereof are provided to increase the number of cell strings by reducing the resistance of a word line without a word line contact. CONSTITUTION: A phase change memory device(300) includes a semiconductor substrate, a junction word line(321), an epitaxial word line(322), and a switching device. The junction word line is formed on the upper side of the semiconductor. The epitaxial word line is formed on the upper side of the junction word line. The switching device is formed on the upper side of the epitaxial word line.</p>
申请公布号 KR20120140397(A) 申请公布日期 2012.12.31
申请号 KR20110060110 申请日期 2011.06.21
申请人 SK HYNIX INC. 发明人 LEE, JANG UK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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