发明名称 TANTALUM SPUTTERING TARGET
摘要 <p>TANTALUM SPUTTERING TARGETProvided is a tantalum sputtering target containing 1 mass ppm or more and 100 mass ppm or less of molybdenum as an essential component, and having a purity of 99.998% or more excluding molybdenum and gas components. Additionally provided is a tantalum sputtering target according to the above further containing 0 to 100 mass ppm of niobium, excluding 0 mass ppm thereof, and having a purity of 99.998% or more excluding molybdenum, niobium and gas components. Thereby obtained is a high purity tantalum sputtering target that has a uniform and fine10 structure and which yields stable plasma and superior film evenness, in other words,uniformity.</p>
申请公布号 SG185978(A1) 申请公布日期 2012.12.28
申请号 SG20120082681 申请日期 2010.08.04
申请人 JX NIPPON MINING & METALS CORPORATION 发明人 FUKUSHIMA ATSUSHI;ODA KUNIHIRO;SENDA SHINICHIRO
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