发明名称 BONDING STRESS TESTING ARRANGEMENT AND METHOD OF DETERMINING STRESS
摘要 A bonding stress testing arrangement and a method of determining stress are provided. The bonding stress testing arrangement includes at least one bond pad; a sensor assembly comprising any one of a first sensor arrangement, a second sensor arrangement and a combination of the first sensor arrangement and the second sensor arrangement; wherein the first sensor arrangement is adapted to measure an average stress on a portion of a bonding area under the at least one bond pad, and the second sensor arrangement is adapted to determine stress distribution over a portion or an entire of the bonding area under the at least one bond pad.
申请公布号 SG185451(A1) 申请公布日期 2012.12.28
申请号 SG20120081881 申请日期 2011.05.03
申请人 AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH 发明人 SELVANAYAGAM, CHERYL SHARMANI;ZHANG, XIAOWU;CHAI, TAI CHONG;TRIGG, ALASTAIR DAVID;CHENG, CHENG KUO;CHEN, XIAN TONG;VAIDYANATHAN, KRIPESH
分类号 主分类号
代理机构 代理人
主权项
地址