发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide stable electric characteristics to a semiconductor device using an oxide semiconductor to achieve high reliability. <P>SOLUTION: A manufacturing method of a transistor including an oxide semiconductor film comprises: forming an amorphous oxide semiconductor film; introducing oxygen into the amorphous oxide semiconductor film to form an oxygen-rich amorphous oxide semiconductor film; forming an aluminum oxide film on the amorphous oxide semiconductor film; and subsequently crystallizing at least a part of the amorphous oxide semiconductor film by performing a heating treatment to form a crystalline oxide semiconductor film. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012256871(A) 申请公布日期 2012.12.27
申请号 JP20120107270 申请日期 2012.05.09
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 HIZUKA JUNICHI;SATO YUHEI;YAMAZAKI SHUNPEI
分类号 H01L21/20;H01L21/336;H01L27/146;H01L29/786 主分类号 H01L21/20
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