发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide stable electric characteristics to a semiconductor device using an oxide semiconductor to achieve high reliability. <P>SOLUTION: A manufacturing method of a transistor including an oxide semiconductor film comprises: forming an amorphous oxide semiconductor film; introducing oxygen into the amorphous oxide semiconductor film to form an oxygen-rich amorphous oxide semiconductor film; forming an aluminum oxide film on the amorphous oxide semiconductor film; and subsequently crystallizing at least a part of the amorphous oxide semiconductor film by performing a heating treatment to form a crystalline oxide semiconductor film. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012256871(A) |
申请公布日期 |
2012.12.27 |
申请号 |
JP20120107270 |
申请日期 |
2012.05.09 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
HIZUKA JUNICHI;SATO YUHEI;YAMAZAKI SHUNPEI |
分类号 |
H01L21/20;H01L21/336;H01L27/146;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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