发明名称 |
MASK BLANK SUBSTRATE, MASK BLANK, REFLECTIVE MASK BLANK, TRANSFER MASK, REFLECTIVE MASK, AND METHOD FOR MAKING THESE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a mask blank substrate, a mask blank and a transfer mask which, during grinding, make it possible to eliminate adverse effects on flatness due to a substrate mark comprising an oblique surface and make it possible to improve flatness, and also to provide a method for making these. <P>SOLUTION: A substrate mark 4 comprising an oblique surface is formed in a mask blank substrate 1, the angle of inclination of the substrate mark 4 with respect to a main surface 112 is greater than 45° but less than 90°, and the distance W<SB POS="POST">1</SB>from the boundary of the substrate mark 4 with the main surface 112 to the outer periphery of the mask blank substrate 1 is less than 1.5 mm. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012256038(A) |
申请公布日期 |
2012.12.27 |
申请号 |
JP20120112104 |
申请日期 |
2012.05.16 |
申请人 |
HOYA CORP |
发明人 |
SASAKI TATSUYA;NISHIMURA TAKAHITO |
分类号 |
G03F1/60;G03F1/24;H01L21/027 |
主分类号 |
G03F1/60 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|