发明名称 MASK BLANK SUBSTRATE, MASK BLANK, REFLECTIVE MASK BLANK, TRANSFER MASK, REFLECTIVE MASK, AND METHOD FOR MAKING THESE
摘要 <P>PROBLEM TO BE SOLVED: To provide a mask blank substrate, a mask blank and a transfer mask which, during grinding, make it possible to eliminate adverse effects on flatness due to a substrate mark comprising an oblique surface and make it possible to improve flatness, and also to provide a method for making these. <P>SOLUTION: A substrate mark 4 comprising an oblique surface is formed in a mask blank substrate 1, the angle of inclination of the substrate mark 4 with respect to a main surface 112 is greater than 45&deg; but less than 90&deg;, and the distance W<SB POS="POST">1</SB>from the boundary of the substrate mark 4 with the main surface 112 to the outer periphery of the mask blank substrate 1 is less than 1.5 mm. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012256038(A) 申请公布日期 2012.12.27
申请号 JP20120112104 申请日期 2012.05.16
申请人 HOYA CORP 发明人 SASAKI TATSUYA;NISHIMURA TAKAHITO
分类号 G03F1/60;G03F1/24;H01L21/027 主分类号 G03F1/60
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