发明名称 Configurable Process Variation Monitoring Circuit of Die and Monitoring Method Thereof
摘要 The present invention discloses a configurable process variation monitoring circuit of a die and monitoring method thereof. The monitoring method includes a ring oscillator, a frequency divider and a frequency detector. The ring oscillator includes a plurality of first standard cells, a plurality of second standard cells and a plurality of multiplexers. The ring oscillator generates an oscillation signal in a first mode or a second mode according to a selection signal. The frequency divider is coupled to the ring oscillator and divides the oscillation signal by a value to generate a divided signal. The frequency divider is coupled to the frequency divider and counts periods of the divided signal by a base clock to generate an output value where the output value is related to the process variation.
申请公布号 US2012326701(A1) 申请公布日期 2012.12.27
申请号 US201213452383 申请日期 2012.04.20
申请人 CHEN YING-YEN;LEE JIH-NUNG;REALTEK SEMICONDUCTOR CORP. 发明人 CHEN YING-YEN;LEE JIH-NUNG
分类号 G01R23/02;H01L27/06 主分类号 G01R23/02
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