发明名称 |
Configurable Process Variation Monitoring Circuit of Die and Monitoring Method Thereof |
摘要 |
The present invention discloses a configurable process variation monitoring circuit of a die and monitoring method thereof. The monitoring method includes a ring oscillator, a frequency divider and a frequency detector. The ring oscillator includes a plurality of first standard cells, a plurality of second standard cells and a plurality of multiplexers. The ring oscillator generates an oscillation signal in a first mode or a second mode according to a selection signal. The frequency divider is coupled to the ring oscillator and divides the oscillation signal by a value to generate a divided signal. The frequency divider is coupled to the frequency divider and counts periods of the divided signal by a base clock to generate an output value where the output value is related to the process variation. |
申请公布号 |
US2012326701(A1) |
申请公布日期 |
2012.12.27 |
申请号 |
US201213452383 |
申请日期 |
2012.04.20 |
申请人 |
CHEN YING-YEN;LEE JIH-NUNG;REALTEK SEMICONDUCTOR CORP. |
发明人 |
CHEN YING-YEN;LEE JIH-NUNG |
分类号 |
G01R23/02;H01L27/06 |
主分类号 |
G01R23/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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