发明名称 SEMICONDUCTOR DEVICE AND A METHOD FOR MANUFACTURING THE SAME
摘要 <p>PURPOSE: A semiconductor device and a manufacturing method thereof are provided to implement a stable electric property by forming an oxide semiconductor layer with a high crystallization region on a gate insulation layer. CONSTITUTION: An oxide semiconductor layer has a crystallization region on an under layer(901). A gate insulation layer is formed on the oxide semiconductor layer. A gate electrode overlaps the oxide semiconductor layer through the gate insulation layer. A pair of electrodes overlap a part of the oxide semiconductor layer. A value obtained by dividing a difference between a lattice constant of the oxide semiconductor layer and a distance of adjacent atoms in the under layer by the distance of the adjacent atoms in the under layer is 0.15 or less in a contact surface between the under layer and the oxide semiconductor layer.</p>
申请公布号 KR20120139560(A) 申请公布日期 2012.12.27
申请号 KR20120062912 申请日期 2012.06.12
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ENDO YUTA;IMOTO YUKI;TAKABAYASHI YUKO;YAMANE YASUMASA
分类号 H01L29/786 主分类号 H01L29/786
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