发明名称 |
SEMICONDUCTOR DEVICE AND A METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>PURPOSE: A semiconductor device and a manufacturing method thereof are provided to implement a stable electric property by forming an oxide semiconductor layer with a high crystallization region on a gate insulation layer. CONSTITUTION: An oxide semiconductor layer has a crystallization region on an under layer(901). A gate insulation layer is formed on the oxide semiconductor layer. A gate electrode overlaps the oxide semiconductor layer through the gate insulation layer. A pair of electrodes overlap a part of the oxide semiconductor layer. A value obtained by dividing a difference between a lattice constant of the oxide semiconductor layer and a distance of adjacent atoms in the under layer by the distance of the adjacent atoms in the under layer is 0.15 or less in a contact surface between the under layer and the oxide semiconductor layer.</p> |
申请公布号 |
KR20120139560(A) |
申请公布日期 |
2012.12.27 |
申请号 |
KR20120062912 |
申请日期 |
2012.06.12 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
ENDO YUTA;IMOTO YUKI;TAKABAYASHI YUKO;YAMANE YASUMASA |
分类号 |
H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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