发明名称 Interconnect structures and methods for back end of the line integration
摘要 A method of forming a semiconductor structure includes forming a sacrificial conductive material layer. The method also includes forming a trench in the sacrificial conductive material layer. The method further includes forming a conductive feature in the trench. The method additionally includes removing the sacrificial conductive material layer selective to the conductive feature. The method also includes forming an insulating layer around the conductive feature to embed the conductive feature in the insulating layer.
申请公布号 US2012329267(A1) 申请公布日期 2012.12.27
申请号 US201113164940 申请日期 2011.06.21
申请人 HORAK DAVID V.;KOBURGER, III CHARLES W.;PONOTH SHOM;YANG CHIH-CHAO;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HORAK DAVID V.;KOBURGER, III CHARLES W.;PONOTH SHOM;YANG CHIH-CHAO
分类号 H01L21/283 主分类号 H01L21/283
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