发明名称 LAYOUT METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A plurality of gate electrode patterns to be laid out in parallel are alternately set as first patterns to be formed in a first exposure step of double patterning and as second patterns to be formed in a second exposure step. Subsequently, a circuit that includes transistor pairs each formed by connecting one of the first patterns and one of the second patterns in parallel is laid out. This reduces the risk of variations in characteristics of transistors caused by double patterning.
申请公布号 US2012329266(A1) 申请公布日期 2012.12.27
申请号 US201213494145 申请日期 2012.06.12
申请人 HIRAMOTO TAKANORI;HINO TOSHIO;SAKATA TSUYOSHI;MIZUNO YUTAKA;OGATA KATSUYA;FUJITSU SEMICONDUCTOR LIMITED 发明人 HIRAMOTO TAKANORI;HINO TOSHIO;SAKATA TSUYOSHI;MIZUNO YUTAKA;OGATA KATSUYA
分类号 G06F17/50;H01L21/768 主分类号 G06F17/50
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