发明名称 HIGH READ SPEED MEMORY WITH GATE ISOLATION
摘要 Providing for a serial array memory transistor architecture that achieves high read speeds compared with conventional serial array memory is described herein. By way of example, the serial array memory can be connected to and can drive a gate voltage of a small capacitance pass transistor, to facilitate sensing memory transistors of the serial array. The pass transistor modulates current flow or voltage at an adjacent metal bitline, which can be utilized to sense a program or erase state(s) of the memory transistors. Due to the small capacitance of the pass transistor, read latency for the serial array can be significantly lower than conventional serial array memory (e.g., NAND memory). Further, various mechanisms for forming an amplifier region of the serial array memory comprising discrete pass transistor are described to facilitate efficient fabrication of the serial array memory transistor architecture.
申请公布号 US2012327717(A1) 申请公布日期 2012.12.27
申请号 US201213600527 申请日期 2012.08.31
申请人 FASTOW RICHARD;NAZARIAN HAGOP;XUE LEI;SPANSION LLC 发明人 FASTOW RICHARD;NAZARIAN HAGOP;XUE LEI
分类号 G11C16/26;G11C16/04;H01L27/088 主分类号 G11C16/26
代理机构 代理人
主权项
地址