发明名称 PRESSURE CONTACT SEMICONDUCTOR DEVICE
摘要 A pressure contact semiconductor device includes a cathode post electrode and a gate electrode formed on a top surface of a substrate, an anode post electrode formed on a bottom surface thereof, a circuit substrate, a cathode flange overlapping the cathode post electrode and connected to the circuit substrate, a cathode fin electrode overlapping the cathode flange, an anode fin electrode underlapping and the anode post electrode, a gate flange connected to both the gate electrode and the circuit substrate, a securing member having a parallel portion parallel to the circuit substrate and a perpendicular portion perpendicular to the circuit substrate, the perpendicular portion being secured to a side of the cathode fin electrode, and a spacer formed from plate material and secured at the top to the parallel portion of the securing member and at the bottom to the circuit substrate.
申请公布号 US2012326208(A1) 申请公布日期 2012.12.27
申请号 US201213371604 申请日期 2012.02.13
申请人 TAGUCHI KAZUNORI;MITSUBISHI ELECTRIC CORPORATION 发明人 TAGUCHI KAZUNORI
分类号 H01L29/744 主分类号 H01L29/744
代理机构 代理人
主权项
地址