发明名称 SEMICONDUCTOR DEVICES AND METHODS OF FABRICATION THEREOF
摘要 <p>PURPOSE: A semiconductor device for minimizing membrane stress and a manufacturing method thereof are provided to form a corrugation part having a soft edge using an etching process. CONSTITUTION: An MEMS(micro electro mechanical system) device comprises a membrane layer(150) arranged on a substrate(100). The membrane layer is supported by a support structure including a spacer structure(210) and a protective layer(240). The membrane layer comprises a corrugation part(25) for relieving stress crossing the membrane layer. The corrugation part comprises a smooth edge without a sharp corner. The reduction of peak stress prevents damage to the membrane layer by reducing crack nucleation. The MEMS device further includes a back plate(200). A plurality of bumps(195) is arranged on the rear side of the back plate. A contact(230) is electrically combined with the back plate, the membrane layer, and the substrate. The plurality of bumps prevents the fixing of the membrane layer by minimizing a contact surface area.</p>
申请公布号 KR20120139565(A) 申请公布日期 2012.12.27
申请号 KR20120063525 申请日期 2012.06.14
申请人 INFINEON TECHNOLOGIES AG 发明人 BARZEN STEFAN;DEHE ALFONS;KLEIN WOLFGANG;FRIZA WOLFGANG
分类号 H04R19/04;H01L29/84 主分类号 H04R19/04
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