| 摘要 |
PURPOSE: A test probe pin, a manufacturing method thereof, and a probe card including the same are provided to reduce overall resistance and absorb mechanical shock caused by test object contact. CONSTITUTION: A test probe pin comprises an upper contact part(10), a lower contact part(20), and a body part(30). The upper contact part is made of conductor and has an upper contact end on top of it. The lower contact part is made of conductor and has a lower contact end at the bottom of it. The body part is made of conductor and integrates the upper and the lower contact parts. Shock absorbing gaps are formed on the body part horizontally at regular intervals.
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